Semiconductor device

A semiconductor device, comprising:

• a power semiconductor device;
• a control IC including a driver circuit to drive the power semiconductor device and a protection circuit to protect the power semiconductor device;
• a case that houses the power semiconductor device and the control IC;
• a chip temperature detector connected to the control IC to measure a chip temperature of the power semiconductor device;
• and
• a case temperature detector connected to the control IC to measure a case temperature that is defined as a temperature at a portion of the semiconductor device other than the power semiconductor device,
• wherein the protection circuit in the control IC includes:
• a chip temperature detection circuit that, when the chip temperature rises and exceeds a first threshold, outputs a chip overheating warning signal so that a warning is communicated to a user, and, when the chip temperature further rises and exceeds a second threshold higher than the first threshold, outputs a chip overheating protection signal to the driver circuit so as to cause the driver circuit to stop switching operation of the power semiconductor device until the chip temperature returns to normal;
• a case temperature detection circuit that, when the case temperature rises and exceeds a third threshold, outputs a case overheating warning signal so that a warning is communicated to the user, and, when the case temperature further rises and exceeds a fourth threshold higher than the third threshold, outputs a case overheating protection signal to the driver circuit so as to cause the driver circuit to stop switching operation of the power semiconductor device until the case temperature returns to normal;
• and
• an abnormality detection circuit connected to one of the chip temperature detection circuit and the case temperature detection circuit to receive the chip overheating warning signal or the case overheating warning signal, the abnormality detection circuit estimating power cycle life of semiconductor device by processing the received chip or case overheating warning signal, and, when the estimated power cycle life has reached a prescribed threshold, generates and outputs an abnormality detection signal to the driver circuit so as to cause the driver circuit to forcedly and permanently stop the switching operation of the power semiconductor device.