Three-dimensional memory device including germanium-containing vertical channels and method of making the same
AssigneeSanDisk Technologies LLC
InventorsYangyin Chen, Christopher Petti
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AssigneeSanDisk Technologies LLC
InventorsYangyin Chen, Christopher Petti
Estimating the term…
An alternating stack of insulating layers and sacrificial material layers is formed over a substrate. The sacrificial material layers are formed as, or are subsequently replaced with, electrically conductive layers. Memory openings are formed through the alternating stack. A memory film is formed within each memory openings. A silicon-germanium alloy layer including germanium at an atomic concentration less than 25% is deposited within each memory opening. An oxidation process is performed on the silicon-germanium alloy layer. A vertical semiconductor channel including an unoxidized remaining material portion of the silicon-germanium alloy layer is formed, which includes germanium at an atomic concentration greater than 50%.
A method of forming a three-dimensional memory device, comprising:
A three-dimensional memory device, comprising:
A three-dimensional memory device, comprising:
Dependencies are inferred from the claim text.