High k metal gate stack with single work-function metal
AssigneeInternational Business Machines Corporation
InventorsTakashi Ando, Balaji Kannan, Siddarth Krishnan, Unoh Kwon, Shahab Siddiqui
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AssigneeInternational Business Machines Corporation
InventorsTakashi Ando, Balaji Kannan, Siddarth Krishnan, Unoh Kwon, Shahab Siddiqui
Estimating the term…
A integrated circuit including an n-doped high-k dielectric layer conformally within a first opening in a dielectric layer such that the n-doped high-k dielectric layer is in direct contact with a portion of a substrate exposed at a bottom of the first opening, a p-doped high-k dielectric layer conformally within a second opening in the dielectric layer such that the p-doped high-k dielectric layer is in direct contact with a portion of the substrate exposed at a bottom of the second opening, a shared work function metal conformally within the first opening and the second opening above and in direct contact with both the p-doped high-k dielectric layer and the n-doped high-k dielectric layer, and a bulk fill material above and in direct contact with the shared work function metal.
An integrated circuit comprising:
An integrated circuit having an N-FET metal gate and a P-FET metal gate sharing the same work function metal, the integrated circuit comprising:
A integrated circuit comprising:
Dependencies are inferred from the claim text.