Circuit test system and method

A circuit test method for testing a circuit of a circuit board, plural test points being formed on the circuit of the circuit board, the circuit test method comprising steps of:

• (a) providing a test platform, wherein the test platform comprises plural contact elements, and the plural contact elements comprise plural strain gauges and plural pogo pins on the corresponding strain gauges;
• (b) calibrating detection values of the strain gauges, so that the pogo pins of the contact elements are located at the same horizontal plane;
• (c) reading a pressure value, a downward displacement and an impedance value of each of the plural contact elements, and defining the pressure value, the downward displacement and the impedance value as a standard pressure value, a standard downward displacement and a standard impedance value, respectively;
• (d) storing the standard pressure value, the standard downward displacement and the standard impedance value;
• (e) loading the standard pressure value, the standard downward displacement and the standard impedance value;
• (f) testing the circuit board, and monitoring and reading the pressure value, the downward displacement and the impedance value of each of the plural contact elements;
• (g) judging whether the pressure value, the downward displacement and the impedance value of each of the plural contact elements are respectively equal to the standard pressure value, the standard downward displacement and the standard impedance value, wherein if the judging condition of the step (g) is not satisfied, an abnormal signal is generated, wherein if the judging condition of the step (g) is satisfied, a next step is performed;
• and
• (h) generating a test record.