Automated Analyzer
AssigneeHitachi High-Technologies Corporation
InventorsMasashi AKUTSU, Akihisa MAKINO, Hiroyuki MISHIMA, Akihiro YASUI
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi High-Technologies Corporation
InventorsMasashi AKUTSU, Akihisa MAKINO, Hiroyuki MISHIMA, Akihiro YASUI
Estimating the term…
The present invention is provided with a sample rack insertion unit 12 that is capable of holding one or more sample racks 5 having mounted therein one or more sample containers 6 accommodating a sample to be analyzed, one or more analysis devices 2, 3 for analyzing the sample accommodated in the sample containers 6, a sample rack conveyance unit 14 for conveying the sample racks 5 from the sample rack insertion unit 12 to the analysis devices 2, 3, and a control device 4 for acquiring, for each analysis device 2, 3, load information that is information expressing an operating condition of the analysis device 2, 3, and, if there is an analysis device 2, 3 for which the load information is larger than a predetermined conveyance permission value, carrying out control so as to stop the conveyance of the sample racks 5 from the sample rack insertion unit 12 to the analysis device(s) 2, 3. As a result of this configuration, it is possible to mitigate in-device sample conveyance congestion occurring as a result of the insertion of many samples and keep the sample environment and analysis processing power at high levels.
to 4. (canceled)
An automatic analysis device comprising:
Dependencies are inferred from the claim text.