In situ microscopy of rotationally deformed sample
AssigneeOxford University Innovation Limited
InventorLars HANSEN
Life of this patent
Estimating the term…
Abstract
A method of observing a solid sample (100) with a microscope (300), comprising engaging a rotating portion (110) with a first part (104) of the sample (100), holding a second part (106) of the sample (100), and rotating the rotating portion (110) so as to rotate the first part (104) of the sample (100) relative to the second part (106) of the sample (100).
Claims23
A method of observing a solid sample with a microscope, comprising engaging a rotating portion with a first part of the sample, holding a second part of the sample, and rotating the rotating portion so as to rotate the first part of the sample relative to the second part of the sample.
8-9. (canceled)
An apparatus arranged to observe a sample with a microscope, comprising a rotating portion which can be engaged with a first part of the sample and a fixing arrangement configured to fix a second part of the sample in place, wherein the rotating portion is configured to rotate the first part of the sample relative to the second part of the sample.
21-22. (canceled)
25-26. (canceled)
Dependencies are inferred from the claim text.