Designs of accurate pm sensors and systems for laboratory & real time calibration / data inversion
AssigneeWashington University
InventorsPratim Biswas, Jiayu Li
Life of this patent
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AssigneeWashington University
InventorsPratim Biswas, Jiayu Li
Estimating the term…
A sensor analysis computer device for analyzing particulate matter is provided. The computer device includes at least one memory and at least one processor in communication with the at least one memory. The computer device is in communication with a sensor configured to measure particulate matter. The at least one processor is programmed to store a plurality of parameter data for the sensor including a calibration factor, receive a plurality of sensor data from the sensor, determine a present calibration factor based on the plurality of parameter data and the plurality of sensor data, determine an updated calibration factor for the sensor based on the present calibration factor and the plurality of parameter data, and transmit the updated calibration factor to the sensor, wherein the sensor is configured to adjust subsequent sensor data based on the updated calibration factor.
A sensor analysis computer device for analyzing particulate matter comprising:
A system for analyzing particulate matter comprising:
Dependencies are inferred from the claim text.