Plasma processing apparatus
AssigneeHitachi High-Technologies Corporation
InventorsNaoyuki KOFUJI, Kenetsu YOKOGAWA, Taku IWASE
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AssigneeHitachi High-Technologies Corporation
InventorsNaoyuki KOFUJI, Kenetsu YOKOGAWA, Taku IWASE
Estimating the term…
A plasma processing apparatus includes a sample stage on which a sample is placed an inside of the processing chamber; a dielectric membrane forming an upper surface portion of the sample stage; a plurality of film-shaped electrodes which is disposed in the dielectric membrane, to which a DC power from a DC power supply is supplied and in which an electrostatic force for attracting the sample is formed; and a bias electrode (ESC base metal) disposed below the dielectric membrane and supplied with radio frequency power for forming a radio frequency bias potential from a radio frequency power supply during the processing of the sample. The plurality of electrodes includes a first electrode to which a positive polarity is imparted and a second electrode to which a negative polarity is imparted, wherein the first electrode and the second electrode are electrically connected to a corresponding positive electrode terminal and a corresponding negative electrode terminal of the DC power supply through the corresponding low pass filter circuits (LPF).
A plasma processing apparatus comprising:
Dependencies are inferred from the claim text.