Nanoparticle Measurement Device, Analysis Device, and Analysis Method
AssigneeJVC KENWOOD Corporation
InventorsShigehiko IWAMA, Masahiro YAMAMOTO, Atsushi SAITO
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AssigneeJVC KENWOOD Corporation
InventorsShigehiko IWAMA, Masahiro YAMAMOTO, Atsushi SAITO
Estimating the term…
A nanoparticle measurement device includes a timing signal generation unit, a low-frequency component extraction unit, a low-frequency component calculation unit, a threshold correction unit, and a measurement unit. The timing signal generation unit generates timing signals. The low-frequency component extraction unit extracts low-frequency components according to the timing signals. The low-frequency component calculation unit calculates an interpolated low-frequency component in accordance with the low-frequency components. The threshold correction unit sets a corrected threshold in accordance with the interpolated low-frequency component. The measurement unit extracts and counts nanoparticle pulse signals from a light reception signal according to the timing signals and the corrected threshold.
A nanoparticle measurement device comprising:
An analysis method comprising:
Dependencies are inferred from the claim text.