Three-dimensional measuring system and measuring method with multiple measuring modes

A three-dimensional measuring system comprising:

• a projector coupled to a memory configured to store a structured light pattern to be projected by the projector onto a measured object, the structured light pattern corresponding to a measurement mode;
• an image sensor for sensing light patterns from the measured object when the structured light pattern is projected onto the measured object;
• and
• one or more processors configured to obtain measurement data corresponding to the measurement mode, wherein the measurement data is expressed using a function D(x) that determines a shortest distance between each of a plurality of selected points xi and a measured surface of the measured object and wherein the plurality of selected points xi are selected within a defined three-dimensional space surrounding a measured area of the measured object.

A three-dimensional measuring system comprising:

• a projector coupled to a memory for storing a plurality of different structured light patterns to be projected by the projector onto a measured object, the plurality of different structured light patterns corresponding to a plurality of different measurement modes;
• an image sensor for sensing light patterns from the measured objected when one of the plurality of different structured light patterns is projected onto the measured object;
• and
• one or more processors configured to at least:
• obtain first point cloud data corresponding to a first measurement mode of the plurality of different measurement modes;
• obtain second point cloud data corresponding to a second measurement mode of the plurality of different measurement modes;
• if the first point cloud data and the second point cloud data are both obtained, align at least the first point cloud data and the second point cloud data to obtain aligned data by expressing the first point cloud data and the second point cloud data in a common coordinate system and use the aligned data to obtain a three-dimensional measuring result corresponding to the measured object;
• and
• if only one of the first point cloud data and the second point cloud data are obtained, use the obtained one of the first point cloud data or the second point cloud data to obtain a three-dimensional measuring result corresponding to the measured object.

A three-dimensional measuring method with multiple measuring modes, the method comprising:

• establishing a uniform data structural model adapted to uniformly express data obtained in different measuring modes;
• obtaining first point cloud data using a first measurement mode corresponding to a first structured light pattern projected onto a measured object by a projector;
• obtaining second point cloud data using a second measurement mode corresponding to a second structured light pattern projected onto the measured object by the projector;
• aligning at least the first point cloud data and the second point cloud data to obtain aligned data by using the uniform data structural model to express the first point cloud data and the second point cloud data in a common coordinate system;
• and
• using the aligned data to obtain a three-dimensional measuring result corresponding to the measured object.