Topological scanning method and system

An inspection system for scanning and analyzing a surface comprising:

• an optical detector configured to scan a target surface of a piece of equipment and generate a plurality of line scan images of the target surface;
• a positioning system configured to transfer the optical detector from a first to a second position;
• a user interface configured to receive user inputs for determining parameters for scanning the target surface and for correcting a scanned image of the target surface to remove at least one undesired feature;
• and
• at least one processor configured to correct the scanned image in accordance with at least one parameter for correcting the scanned image, and analyze the corrected image to determine at least one geometric parameter of the target surface.

A non-transitory computer readable medium storing computer-executable instructions that when executed by a computer perform a method for scanning and analyzing a surface, the method comprising:

• receiving a piece of equipment with a target surface for inspection;
• receiving an input from a user;
• determining at least one scan parameter based on the user input;
• scanning the target surface using an optical detector in accordance with the at least one scan parameter;
• generating an image of the target surface;
• correcting the image of the target surface to remove at least one undesired feature to generate a corrected image based on the at least one scan parameter;
• and
• analyzing the corrected image to determine at least one geometric parameter of the target surface.