Defect inspection method and system for solar cell

A defect inspection method for a solar cell, applicable to a defect inspection system having a measuring device, a processing device, and an output device, wherein the processing device is connected to the measuring device and the output device, and wherein the method comprises:

• measuring a plurality of output voltages and a plurality of output currents of the solar cell by the measuring device;
• generating a stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) by the processing device according to the output voltages and the output currents, wherein the stepwise IV curve comprises a plurality of steps, wherein the fitted IV curve corresponds to an ideal current-voltage curve when the solar cell has no defect;
• determining whether a first error of the fitted IV curve is less than a first error tolerance by the processing device;
• when the first error is not less than the first error tolerance, determining whether there exists at least one surge in each of the steps of the stepwise IV curve by the processing device so as to accordingly determine whether the solar cell has a defect;
• and
• outputting a determined result of the processing device by the output device.