Thin-film transistor substrate
AssigneeMitsubishi Electric Corporation
InventorsKazunori INOUE, Takeshi KUBOTA
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitsubishi Electric Corporation
InventorsKazunori INOUE, Takeshi KUBOTA
Estimating the term…
A first gate insulating layer and a protective insulating layer are made of silicon nitride. A second gate insulating layer is provided on gate electrodes via a first gate insulating layer. A first intersecting layer is provided on gate lines via a first gate insulating layer. A channel layer has the same shape as the second gate insulating layer. A second intersecting layer is provided on and has the same shape as the first intersecting layer. Source lines intersect with the gate lines on the second intersecting layer. The first gate insulating layer and the protective insulating layer have gate contact holes. The protective insulating layer has source contact holes. The second gate insulating layer, the channel layer, and the first and second intersecting layers are made of oxide and have a common species of elements and a common crystal structure.
A thin-film transistor substrate having a plurality of pixel regions arranged in a matrix, and including a plurality of thin-film transistors that correspond respectively to the plurality of pixel regions, the thin-film transistor substrate comprising:
A thin-film transistor substrate having a plurality of pixel regions arranged in a matrix, and including a plurality of thin-film transistors that correspond respectively to the plurality of pixel regions, the thin-film transistor substrate comprising:
A thin-film transistor substrate having a plurality of pixel regions arranged in a matrix, and including a plurality of thin-film transistors that correspond respectively to the plurality of pixel regions, the thin-film transistor substrate comprising:
Dependencies are inferred from the claim text.