A method for production control of an integrated circuit, said method performed after soldering a soldered element onto at least one solder pad of the integrated circuit, wherein said solder pad includes, in a superposition of a plurality of metallization levels, an underlying structure comprising a network of first parallel metal tracks present in at least two metallization levels and which are arranged for reinforcing a mechanical strength of said underlying structure and for establishing an electrical connection between an upper metallization level and a lower metallization level of the underlying structure, and further includes a detection electrical path within the underlying structure that includes, in said at least two metallization levels, second metal tracks insulated from and passing between the first parallel metal tracks, the method comprising:
- performing a test phase which includes measuring a resistive value of the detection electrical path between an input terminal and an output terminal;
- and
- performing a decision phase based on the measured resistive value to generate a quality signal indicating a determined quality of said integrated circuit.