Semiconductor Chip Comprising a Multiplicity of External Contacts, Chip Arrangement and Method for Checking an Alignment of a Position of a Semiconductor Chip

A semiconductor chip, comprising:

• a mounting surface comprising a plurality of first conductive contacts and a second conductive contact,
• wherein each of the first contacts in the plurality is arranged in a regularly spaced apart array such that centroids of immediately adjacent ones of the first contacts are separated from one another in a first direction by a first distance,
• wherein each of the first contacts in the plurality have an identical first lateral extent, and
• wherein the second conductive contact is disposed in the first direction between the regularly spaced apart array and a first outer edge side of the semiconductor chip,
• wherein at least one of the following is true:
• the second conductive contact has a second lateral extent that is less than the first lateral extent;
• or
• a centroid of the second conductive contact is separated in the first direction from the centroid of an immediately adjacent one of the first contacts by a second distance that is different from the first distance.

A semiconductor chip, comprising:

• a mounting surface comprising a plurality of first conductive contacts and a second conductive contact,
• wherein each of the first contacts in the plurality is arranged in a regularly spaced apart array such that centroids of immediately adjacent ones of the first contacts are separated from one another in a first direction by a first distance,
• wherein a central one of the first contacts is surrounded on either side by outer ones of the first contacts,
• wherein each of the first contacts in the plurality have an identical first lateral extent,
• wherein the second contact has a second lateral extent that is less than the first lateral extent, and
• wherein the second conductive contact is disposed between two of the first contacts in the first direction such that first and second distances between the second conductive contact and the two of the first contacts are each less than the first distance.