Methods, devices, and systems for reducing device test time

A method for testing and grading electronic devices, the method comprising:

• receiving a set of testing data associated with an electronic device that is following a testing routine, wherein the set of testing data is generated during a plurality of tests on the electronic device;
• based on the set of testing data, computing a first performance metric of the electronic device by using a first artificial neural network;
• based on the set of testing data, computing a second performance metric of the electronic device by using a second artificial neural network;
• based on at least the first performance metric and the second performance metric, computing a grade for the electronic device;
• determining whether the computed grade is below or above a predetermined threshold;
• if the computed grade is below the predetermined threshold, generating an updated testing routine for the electronic device;
• and
• if the computed grade is above the predetermined threshold, continuing to follow the testing routine.

A system for grading an electronic device, the system comprising:

• a computing device comprising a first trained artificial neural network, a second trained artificial neural network, a processor, and a memory, wherein
• the computing device is configured to:
• receive a set of testing data associated with an electronic device and generated during a plurality of tests on the electronic device,
• compute a first performance metric of the electronic device using the first trained artificial neural network and the received set of testing data,
• compute a second performance metric of the electronic device using the second trained artificial neural network and the received set of testing data, and
• compute a grade for the electronic device based on at least the first performance metric and the second performance metric.