Measurement apparatus, measurement instruction apparatus, measurement system, and non-transitory computer-readable recording medium
AssigneeMitsubishi Electric Corporation
InventorsTakashi IWAKURA, Takayuki ISHIDA
Life of this patent
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Abstract
A measurement apparatus is to be mounted on a flying craft that flies in vicinity of the architectural structure and the measurement apparatus controls the flying craft to move to a measurement position indicated as a relative position with respect to a position of the flying craft and measures the architectural structure.
Claims11
A measurement apparatus to be mounted on a flying craft that flies in vicinity of an architectural structure, the measurement apparatus controlling the flying craft to move to a measurement position indicated as a relative position with respect to a position of the flying craft and measuring the architectural structure.
A measurement instruction apparatus to perform an observation of a position of an architectural structure and a position of a flying craft that flies in vicinity of the architectural structure and, based on the result of the observation, to provide a measurement apparatus on the flying craft an instruction indicating a measurement position where the measurement apparatus is to measure the architectural structure as a relative position with respect to the position of the flying craft.
A non-transitory computer-readable recording medium storing a program for causing a computer to execute processing comprising:
- performing an observation of a position of an architectural structure and a position of a flying craft;
- providing, based on a result of the observation, an instruction indicating a measurement position where the architectural structure is to be measured as a relative position with respect to the position of the flying craft;
- and
- measuring the architectural structure at the measurement position.
Dependencies are inferred from the claim text.