Arrangement for microscopy and for correction of aberrations

An arrangement for microscopy, comprising

• an illumination optical unit with an illumination objective for illuminating a specimen situated on a specimen carrier in a specimen region of a specimen plane via an illumination beam path, said illumination objective having an optical axis, wherein said optical axis lies in a plane which includes an illumination angle that differs from zero with the normal of the specimen plane, in respect of which the specimen carrier is aligned, and illumination is implemented in the plane,
• a detection optical unit with a detection objective in a detection beam path, said detection objective having a detection optical axis, the detection optical axis includes a detection angle that differs from zero with the normal of the specimen plane,
• the illumination objective includes an illumination correction element that is arranged in the illumination beam path or introducible into the illuminating beam path, and/or
• the detection objective includes a detection correction element that is arranged in the detection beam path or introducible into the detection beam path,
• a meniscus lens being located between the specimen carrier and the illumination and detection objectives, said meniscus lens being arranged both in the illumination beam path and in the detection beam path;
• the meniscus lens being configured to correct aberrations that arise on account of the passage through media with different refractive indices of radiation to be detected and/or radiation for illuminating the specimen, and
• the illumination correction element and/or the detection correction element being configured to correct remaining aberrations.