Method of and microscope with installation for focus stabilization
AssigneeDeutsches Krebsforschungszentrum
InventorJohann Engelhardt
Life of this patent
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Abstract
In a method of monitoring a relative position of a microscope objective with regard to a sample a test beam of light is directed onto at least one at least partially reflective surface connected to the sample, and light of the test beam reflected at the at least one at least partially reflective surface is registered and evaluated. Additionally, the test beam is directed onto a reflective surface of the microscope objective facing the sample, and light of the test beam reflected at the reflective surface of the microscope objective is also registered and evaluated.
Claims16
A method of monitoring a relative position of a microscope objective with regard to a sample, the method comprising
- directing a test beam of light onto at least one at least one partially reflective surface connected to the sample,
- registering and evaluating first reflected light of the test beam that is reflected at the at least one at least one partially reflective surface,
- also directing the test beam onto a reflective surface of the microscope objective facing the sample, and
- registering and evaluating second reflected light of the test beam that is reflected at the reflective surface of the microscope objective,
- wherein the test beam is directed from a side of the sample facing away from the microscope objective through the at least one partially reflective surface connected to the sample onto the reflective surface of the microscope objective, and
- wherein the first reflected light and the second reflected light are both registered at that side of the sample facing away from the microscope objective.
A microscope comprising
- a microscope objective,
- a microscope slide configured to hold a sample, and
- an installation for monitoring a relative position of the microscope objective with regard to the sample, the installation comprising
- a light source configured to direct a test beam of light onto at least one at least one partially reflective surface connected to the microscope slide, and
- a detector configured to register first reflected light of the test beam that is reflected at the at least one surface,
- wherein the light source is configured to also direct the test beam onto a reflective surface of the microscope objective facing the sample,
- wherein the detector is configured to also register second reflected light of the test beam reflected at the reflective surface of the microscope objective,
- wherein the light source and the detector are both arranged at a side of the microscope slide facing away from the microscope objective, and
- wherein the light source is configured to direct the test beam through the at least one partially reflective surface connected to the microscope slide onto the reflective surface of the microscope objective.
Dependencies are inferred from the claim text.