Test apparatus and test method
AssigneeAdvantest Corporation
InventorNAGATANI KENICHI
Life of this patent
Estimating the term…
Abstract
A time measurement unit measures the time interval between edges to be monitored in a signal under test DUT_Output including serial data output from a device under test (DUT) 400. A comparison judgment unit calculates the number of bits of the serial data included between the edges to be monitored, based on the time interval thus measured. Furthermore, the comparison judgment unit compares the number of bits thus calculated with an expected value thereof.
Claims20
A test apparatus comprising:
- a time measurement unit operable to measure a time interval between edges monitored in a signal under test including serial data output from a device under test;
- and
- a comparison judgment unit operable to calculate a number of bits included between the edges monitored, based on the measured time interval, and to compare the number of bits with an expected value to generate a comparison result.
A test method for a signal under test including serial data output from a device under test, the test method comprising:
- measuring a time interval between edges monitored in the signal under test;
- calculating a number of bits of the serial data output included between the edges monitored, based on the time interval that is measured;
- and
- comparing the number of bits that is calculated with an expected value to generate a comparison result.
A test apparatus comprising:
- a jitter remover operable to remove jitter from a serial data sequence by rounding a calculated number of bits between edges monitored of the serial data sequence to generate a rounded result and by comparing the rounded result with an expected value to generate a comparison result.
Dependencies are inferred from the claim text.