Sleek serial interface for a wrapper boundary register (device and method)
AssigneeX-Fab Semiconductor Foundries AG
InventorUlrike Mueller-Schniek
Life of this patent
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AssigneeX-Fab Semiconductor Foundries AG
InventorUlrike Mueller-Schniek
Estimating the term…
Invention achieves reduced amount of terminals to control a test mode, test function and test results of a given standard for at least one “wrapped core” (40,100) (a core 100 surrounded by a wrapper boundary register (40) as “wrapper chain”). Test flexibility and speed of testing the core (100) are also improved. Suggested serial test interface comprises a state machine (210) and an instruction register (213) for wrapper-instructions, supplied through a single physical data input terminal (1a). The state machine (210) reads wrapper-instructions held by the instruction register (213) and generates on-chip wrapper control signals (30) of the given standard for the wrapper boundary register (40) of the core (100). At least one wrapper-instruction read from the Instruction Register (213) provides at least one wrapper control signal (30). The single input terminal (1a) also supplies an input test signal SDI for coupling to the wrapper boundary register (40) as on chip logical input test signal WSI. A single output terminal (1b) returns an output test signal SDO from an output WSO of the wrapper boundary register (40). Invention may apply to IEEE 1500 control signals.
Serially operable interface device on a chip (1), the interface device (201) for generating control signals for a Wrapper Boundary Register (40,WBR) on chip (1) level, said wrapper control signals (30) complying with a given standard for testing a core device (100), said core device provided on the chip (1) as well and having the WBR, the serial interface device (201) comprising
A serially-operable interface device on a chip (1), the interface device (201) for generating control signals for a Wrapper Boundary Register (40, WBR) on chip (1) level, said wrapper control signals (30) complying with a given standard for testing a core device (100), said core device provided on the chip (1) as well and having the WBR, the serial interface device (201) comprising:
Device of one of previous claims, further having a counter (211) to control a data transmission size in certain states (READ_DEV_ADR, READ_INSTRUCTION, SEND_IDCODE, READ_DATA and READ_UPDATE) of the state machine (210), the counter receiving the clock signal (SCLK) supplied to the serial interface device.
Device of one of previous claims, the state machine (210) handling transactions between the external master (10) and itself, wherein the state machine (210) is capable to generate an additional Wrapper Boundary Register control signal (WT), e.g. WCH_RESET, to and for the Wrapper Boundary register (WBR,40) of the core device (100).
Device of one of previous claims, wherein the State Machine (210) is configured and capable to generate all Wrapper Boundary Register control signals (30;
Device of one of previous claims, wherein an output signal (WSO) of the Wrapper Boundary Register (40;WBR) is supplied to the serial interface device (201) or directly to the terminal (2b) of the physical Data Output (SDO).
Device of one of previous claims, wherein the logical data input signal (SDI) at physical Data Input Terminal (1a) is supplied, preferably directly, to the WBR (40) as Input Signal (WSI).
Device of one of previous claims, wherein the clock signal (SCLK) from the third terminal (1c) is also supplied, preferably directly, to the WBR (40) as clock signal (WRCK).
Device of one of previous claims, wherein the clock signal (SCLK) from the third terminal (1c) is supplied to the serial interface device (201), preferably therewith to the control logic (209) containing the state machine (210), the Address Register (214) and the Instruction Register (213).
Device of one of previous claims, wherein the logical data input signal (SDI) at physical Data Input Terminal (1a) is supplied to the Address Register (214), the Instruction Register (213) and to the control logic (209) containing the state machine (210), but not to the state machine (210).
Device of one of previous claims, wherein the coupling is an electrical conductive connection.
Device of one of previous claims, further having an Identification Register (215) containing an identification-code (215a) of the core device (100).
Device of one of previous claims, the serial interface device (201) further having an additional device-address source, supplying a device-address (214a) of a corresponding core device (100a) associated with the interface device, when multiple cores (100a, 100b) are on the chip (1) and each core has an own dedicated serial interface device (201a, 201b).
Device of one of previous claims, further having a counter (211), supplied with the clock signal (SCLK) through the third terminal (1c) to control the changes of states (510, 520, 525, 530, 550) of the state machine (210).
Serially operable interface device on a chip (1), the interface device (201) for generating control signals for a Wrapper Boundary Register (40;WBR) on chip (1,1*) level, said wrapper control signals (30) complying with a given standard for testing a core device (100), said core device provided on the chip (1) as well and having the WBR (40), the chip (1;1*) comprising
A serially-operable interface device on a chip (1), the interface device (201) for generating control signals for a Wrapper Boundary Register (40;WBR) on chip (1,1*) level, said wrapper control signals (30) complying with a given standard for testing a core device (100), said core device provided on the chip (1) as well and having the WBR (40), the chip (1;1*) comprising:
Device of one of previous claims, the serial interface device (201) further having an Address Register (214) to receive and hold an address supplied through the physical data input terminal (1a) for comparison with an individual device-address (214a) of this serial interface device (201a) and a corresponding core (100a), when multiple serial interface devices (201a,201b,201c) each attributed to a corresponding core (100a,100b,100c) are present on the chip (1*).
Device of one of previous claims, wherein the control logic (209) has access to an Address Register (214), being configured for holding a received address, the control logic (209) being configured for reading the address as held by the Address Register (214).
Device of one of previous claims, further having a counter (211), supplied with the clock signal (SCLK) through the third terminal (1c) to control at least some changes of states (510, 520, 525, 530, 550) of the state machine (210).
Device of previous claim, wherein at least some changes of states of the state machine (210) depend at least from a counter value of the counter (211) and a wrapper-instruction as read from the Instruction Register (213), the Instruction Register (213) having received the wrapper-instruction through the physical data input terminal (1a).
Device of one of previous claims, further having an Identification Register (215) for holding an ID-Code (215a) identifying the core device (100).
Device of previous claim, the ID-Code of the Identification Register (215) identifying the core device (100) is sent by control of the state machine (210) and a control logic (209) in the serial test interface (201) to the single output terminal (1b) to the external master (10), upon an corresponding wrapper-instruction as read from the Instruction Register (213).
Device of previous claim, the control logic (209) in the serial test interface (201) acts as gateway to the single output terminal (1b) for supplying either—but not both at the same time—the ID-Code (215a) of the Identification Register (215) or the logical output test signal (WSO) returning from the WBR (40) of the core device (100) to the external master (10) by control of the control logic (209) upon an corresponding wrapper-instruction as read from the Instruction Register (213).
Device of one of previous claims, further having a power-on detector (20) for supplying a power on reset signal to the serial test interface (201) and the Wrapper Boundary Register (40) of the core (100) for common initialisation.
Device of one of previous claims, the clock signal (SCLK) supplied through the third terminal (1c) is supplied to the WBR (40) and the serial test interface (201).
Test method of testing wrapped cores (100a, 100b, 100c) within a System-on-Chip (SoC;1*), wherein
A device for testing wrapped cores (100a, 100b, 100c) within a System-on-Chip (SoC;1*), wherein:
-44. (canceled)
Method to skip a state of a state machine (210) in a selected serial interface device (201), the state machine (210) having a state (510) of reading a device-address (READ DEV ADR), the method comprising . . .
Method of generating IEEE 1500 Wrapper Boundary Register (WBR) control signals (30) by a state machine (210) having several states, the state machine being part of a functional slave (201) in a System on Chip (SoC) configuration, the method comprising the steps
Method to generate additional Wrapper Boundary Register (WBR) control signals (30) by a state machine (210) on a chip (1,1*), the method comprising the steps of
Layout for a serial test interface comprising a layout for an Instruction Register (213) to receive and hold wrapper-instructions supplied through a representation of a physical data input terminal (2a) and a layout of a state machine (210) for handling transactions supplied thereto, wherein the state machine is layouted to read a wrapper-instruction from the Instruction Register (213) and generate and provide wrapper control signals (30) of the given standard for a core device (100) having the Wrapper Boundary Register (40) according to the wrapper-instruction read from the Instruction Register;
Dependencies are inferred from the claim text.