Probe head securing mechanism for probe assembly

A method of testing, comprising:

• securing a probe head assembly in a probe assembly comprising:
• inserting the probe head assembly through a lock ring of the probe assembly, the lock ring being at a first position relative to a lock ring housing of the probe assembly, the lock ring being disposed in the lock ring housing of the probe assembly, the lock ring housing being attached to a rigid substrate of the probe assembly, a circuit board being disposed between the lock ring housing and the rigid substrate;
• and
• rotating the lock ring relative to the lock ring housing to a second position relative to the lock ring housing, the lock ring at the second position applying a force to the probe head assembly to secure the probe head assembly;
• and
• testing a wafer using the probe head assembly secured in the probe assembly.

A probe assembly comprising:

• a rigid substrate;
• a circuit board coupled to the rigid substrate;
• and
• a probe head securing mechanism comprising:
• a lock ring having a flange along a lateral exterior;
• and
• a lock ring housing coupled to the rigid substrate, the circuit board being disposed between the lock ring housing and the rigid substrate, the lock ring housing having an interior sidewall at least partially encircling the lock ring, the interior sidewall having a helical channel, the flange of the lock ring being engaged in the helical channel, the lock ring being rotatable relative to the lock ring housing, the flange being moveable along the helical channel during rotation of the lock ring.