Burn-in test device and test method using interposer
AssigneeSamsung Electronics Co., Ltd.
InventorJoosung YUN
Life of this patent
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Abstract
A test device includes a connecting circuit and a chamber. The connecting circuit includes an interposer to transfer a test signal to operate a device under test. The chamber includes a pin electronic circuit to generate a control signal to control an operation of the device under test based on the test signal received through the interposer. The pin electronic circuit is spatially disposed within the chamber and generates the control signal. When the test signal is received, an internal temperature of the chamber is higher or lower than an external temperature of the chamber when the test signal is received.
Claims21
A test device, comprising:
- a connecting circuit including an interposer to transfer a test signal to operate a device under test;
- and
- a chamber including a pin electronic circuit to generate a control signal to control an operation of the device under test based on the test signal received through the interposer, wherein the pin electronic circuit is spatially disposed within the chamber and generates the control signal, and wherein an internal temperature of the chamber is higher or lower than an external temperature of the chamber when the test signal is received.
A test device, comprising:
- a system circuit to generate a test signal to test an operation of a device under test based on a request of a host;
- a chamber including a pin electronic circuit to generate a control signal to control the operation of the device under test based on the test signal;
- and
- a connector to electrically connect the system circuit and the chamber by an interposer stacked between the system circuit and the chamber, wherein an internal temperature of the chamber is higher or lower than an external temperature of the chamber based on the request of the host to test the operation of the device under test.
-20. (canceled)
A non-transitory, computer-readable medium comprising instructions which, when executed, cause a processor to perform a method of:
- generating, by a system circuit of a test device, a test signal to test a device under test;
- transferring the test signal through an interposer stacked between the system circuit and the test device;
- generating, by a pin electronic circuit spatially disposed within a chamber, a control signal to control an operation of the device under test based on the test signal transferred through the interposer;
- and
- testing the device under test based on the control signal at a temperature that is higher or lower than an external temperature of the chamber.
Dependencies are inferred from the claim text.