Test and Measurement Probe Coupler
AssigneeTektronix, Inc.
InventorJosiah A. Bartlett
Life of this patent
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AssigneeTektronix, Inc.
InventorJosiah A. Bartlett
Estimating the term…
A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.
A test and measurement probe coupler comprising:
A method of using a test and measurement probe coupler, the method comprising:
Dependencies are inferred from the claim text.