Probe manufacturing method and probe

A method for manufacturing a probe protruding from a cantilever, comprising the step of:

• dipping the cantilever made of a semiconductor, the cantilever having a part coated with a first metal having a Fermi level higher than that of the semiconductor and having another part from which a needle-shaped body protrudes, into a solution containing ions of a second metal, to manufacture a probe in which structures of the second metal are precipitated at a tip end of the needle-shaped body.

A method for manufacturing a probe protruding from a cantilever, comprising the step of:

• dipping the cantilever made of a semiconductor, the cantilever having a part from which a needle-shaped body protrudes, into a solution containing ions of a second metal and having a Fermi level lower than that of the semiconductor, thereby supplying electrons from the needle-shaped body to the ions of the second metal in the solution and manufacturing a probe in which structures of the second metal are precipitated at a tip end of the needle-shaped body.

A probe protruding from a cantilever, comprising:

• a needle-shaped body protruding from a part of the cantilever, wherein the cantilever is made of a semiconductor and another part of the cantilever is coated with a first metal having a Fermi level higher than that of the semiconductor;
• and
• structures of a second metal precipitated at a tip end of the needle-shaped body by dipping the cantilever into a solution containing ions of the second metal.

A probe protruding from a cantilever, comprising:

• a needle-shaped body protruding from a part of the cantilever made of a semiconductor;
• and
• structures of a second metal precipitated at a tip end of the needle-shaped body by dipping the cantilever into a solution containing ions of the second metal.