System for Analyzing a Test Sample and Method Therefor

An apparatus comprising:

• a sample holder (104) having a sample-collection surface (304) comprising a first planar surface (310) and a plurality of features (312) that project from the first planar surface, wherein the plurality of features collectively defines a plurality of voids (320) configured to locate a test sample (112);
• a radiation source (102) that is operative for providing an interrogation signal (118) to the test sample;
• a detector (106) that is operative for detecting the spectral content of an output signal (120), wherein the spectral content is based on an interaction between the interrogation signal and the test sample;
• and
• a processor (108) that is operative for estimating the identity of a first analyte in the test sample based on the spectral content.