Electron microscopy
AssigneeUnited Kingdom Research and Innovation
InventorsMEINDERT HUGO LAMERS, RAFAEL FERNANDEZ-LEIRO, JOSHUA FIRMAN
Life of this patent
Estimating the term…
Loading patent…
AssigneeUnited Kingdom Research and Innovation
InventorsMEINDERT HUGO LAMERS, RAFAEL FERNANDEZ-LEIRO, JOSHUA FIRMAN
Estimating the term…
Aspects and embodiments relate to electron microscopy sample preparation apparatus; and a method of preparing an electron microscopy sample. Aspects and embodiments provide electron microscopy sample preparation apparatus. The apparatus comprises a support holder configured to receive an electron microscopy sample support, the electron microscopy sample support configured to receive a fluid sample. The apparatus comprising a gas outlet configured to direct a flow of gas towards a surface of the electron microscopy sample support to adjust fluid supported by the electron microscopy sample support. Aspects and embodiments recognise that in order to be successfully imaged, a specimen must be adequately prepared for imaging. Successful and reproducible preparation of an electron microscopy sample or specimen may be key to obtaining useful results from microscopy techniques. It will be appreciated that incorrect or unsuccessful preparation of a specimen for examination, may result in damage to a specimen, poor and/or irreproducible results.
Electron microscopy sample preparation apparatus;
3-5. (canceled)
(canceled)
9-11. (canceled)
(canceled)
15-18. (canceled)
20-21. (canceled)
23-26. (canceled)
29-31. (canceled)
35-36. (canceled)
38-41. (canceled)
A method of preparing an electron microscopy sample preparation;
43-81. (canceled)
Dependencies are inferred from the claim text.