Methods and assemblies for using electrostriction to characterize properties of optical fiber
AssigneeCiena Corporation
InventorsAndrew D. SHINER, Michael Andrew REIMER, Maurice O'SULLIVAN
Life of this patent
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AssigneeCiena Corporation
InventorsAndrew D. SHINER, Michael Andrew REIMER, Maurice O'SULLIVAN
Estimating the term…
Methods and assemblies for determining a property or environment of an optical fiber, including: measuring a frequency dependent electrostrictive response of an optical fiber; and based on the measured frequency dependent electrostrictive response, determining a property of the optical fiber. The property or environment of the optical fiber includes one or more of optical fiber type, optical fiber material type, optical fiber material property, optical fiber area, optical fiber geometry, optical fiber condition, optical fiber stress and strain, optical fiber environment, optical fiber temperature, optical fiber routing, optical fiber spooling, and optical fiber radiation exposure.
A method for estimating a property or environment of an optical fiber, comprising:
An assembly for estimating a property or environment of an optical fiber, comprising:
A method of reducing uncertainty in the estimate of a measured fiber property of an optical fiber, comprising:
Dependencies are inferred from the claim text.