Failure determination circuit, physical quantity measurement device, electronic apparatus, and vehicle
AssigneeSeiko Epson Corporation
InventorTakashi AOYAMA
Life of this patent
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AssigneeSeiko Epson Corporation
InventorTakashi AOYAMA
Estimating the term…
A failure determination circuit includes a switching circuit that receives a signal including an output voltage from a temperature sensor and a first reference voltage and outputs the signal in a time division manner, an A/D conversion circuit that A/D converts an output of the switching circuit, and a first determination circuit, and the first determination circuit determines a failure of the temperature sensor based on a signal based on a first digital signal obtained by A/D converting an output voltage from the temperature sensor by the A/D conversion circuit, a signal based on a second digital signal obtained by A/D converting the first reference voltage by the A/D conversion circuit, and temperature characteristics data based on a change in characteristics of the temperature sensor due to temperature and a change in characteristics of the first reference voltage due to temperature.
A failure determination circuit comprising:
Dependencies are inferred from the claim text.