Semiconductor memory device and method of operating the same

A semiconductor memory device comprising:

• a normal cell region including a plurality of normal region groups, each of the normal region groups including a plurality of sub regions, the plurality of sub regions included in respective ones of the normal region groups arranged one by one sequentially in a column direction according to a round-robin scheme;
• a redundancy cell region configured to replace failed memory cells of the normal cell region;
• and
• a repair control circuit configured to,
• determine a target normal region group from among the plurality of normal region groups based on an input address,
• extract target fail addresses from among a plurality of fail addresses based on the target normal region group, and
• control a repair operation based on the target fail addresses and the input address.

A method of operating a semiconductor memory device, the semiconductor memory device including a normal cell region and a redundancy cell region, the normal cell region divided into a plurality of normal region groups, and the redundancy cell region configured to replace failed memory cells of the normal cell region, the method comprising:

• determining a target normal region group from among the plurality of normal region groups based on an input address;
• extracting target fail addresses from among a plurality of fail addresses based on the target normal region group;
• and
• controlling a repair operation based on the target fail addresses and the input address.