Determining frequency of transmitter signal source based on received signal
AssigneeBaker Hughes, A Ge Company, LLC
InventorKersten Kraft
Life of this patent
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AssigneeBaker Hughes, A Ge Company, LLC
InventorKersten Kraft
Estimating the term…
A method to measure a parameter of interest is provided. The method includes receiving a first signal via an antenna of a reception circuit. The method further includes generating a second signal by a signal generator of the reception circuit. The method further includes mixing the first signal and the second signal in a mixer of the reception circuit to generate a third signal. The method further includes measuring a parameter of the third signal using an instrument. The method further includes adjusting, by a processor, a frequency of the second signal to substantially match a frequency of the first signal based at least in part on the measured parameter of the third signal. The method further includes determining, by the processor, the parameter of interest using the adjusted frequency of the second signal.
A method to measure a parameter of interest comprising:
A reception circuit to measure a parameter of interest, the reception circuit comprising:
Dependencies are inferred from the claim text.