Radiographic product inspection system with reject bin
AssigneeMettler-Toledo AG
InventorsKamil Kaminski, Ivana Nanut
Life of this patent
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AssigneeMettler-Toledo AG
InventorsKamil Kaminski, Ivana Nanut
Estimating the term…
In an X-ray inspection system (1), a reject bin (14) is split into a reject bin top (15) and a reject bin bottom (16) along a separation gap (17) which is arranged at the level of a transport section (21) of a conveyor belt loop (10) and runs uninterrupted from the outfeed opening (26) to the conveyor access opening (43) which, in turn, continues uninterrupted to the infeed opening (8). After a conveyor access door (19) has been opened and a tensioning mechanism (32) has been released, the conveyor belt loop can be taken out of the enclosure cabinet (5) by sliding the transport section (21) through the separation gap and the conveyor access opening and simultaneously slipping a return section (22) of the conveyor belt loop around the reject bin bottom.
A system for inspecting inspection objects using radiation, comprising:
Dependencies are inferred from the claim text.