Optical analysis device and optical analysis method

An optical analysis device that analyzes an optical parameter of a measurement target having anisotropy, the optical analysis device comprising:

• a terahertz wave generation module that generates a terahertz wave;
• a terahertz wave detection unit that detects the terahertz wave generated by the terahertz wave generation module;
• a placement portion for the measurement target disposed on an optical path of the terahertz wave between the terahertz wave generation module and the terahertz wave detection unit;
• an electric field vector measurement unit that measures an electric field vector of the terahertz wave detected by the terahertz wave detection unit;
• an optical parameter analysis unit that analyzes an optical parameter of the measurement target on the basis of a measurement result of the electric field vector from the electric field vector measurement unit;
• and
• a frequency signal generation unit that generates a predetermined frequency signal,
• wherein the terahertz wave generation module includes
• a terahertz wave generation unit that generates the terahertz wave according to incidence of light, and
• a polarization switching unit that periodically switches a polarization state of the terahertz wave between a first polarization state and a second polarization state that are different from each other on the basis of the frequency signal,
• the electric field vector measurement unit detects a first electric field vector of the terahertz wave in the first polarization state and a second electric field vector of the terahertz wave in the second polarization state by referring to the frequency signal, and
• the optical parameter analysis unit determines an optical parameter of the measurement target from an intersection between first analysis data based on spectral data obtained by performing Fourier transformation on a product of the first electric field vector and a rotation matrix and second analysis data based on spectral data obtained by performing Fourier transformation on a product of the second electric field vector and the rotation matrix.