US 2018/0324381 A1 · SOLID-STATE IMAGING DEVICE AND CAMERA SYSTEM

Abstract

A solid-state imaging device includes a pixel array with unit pixels each having a photoelectric conversion device arranged in a matrix. Column signal lines are wired with respect to one column in the pixel arrangement and pixels are regularly connected to the column signal lines in accordance with rows in which pixels are positioned. A pixel signal reading unit has a column processing unit that reads pixel signals in units of plural pixels from the pixel array and performs column processing to read signals on a column basis, wherein the pixel signal reading unit includes a column input unit which can connect one or plural column signal lines arranged at a corresponding column to an input of one column processing unit through plural capacitors connected in parallel The column input unit has switches which can change a connection state between capacitors and column signal lines corresponding to the column.

Claims13

Dependent claims

(canceled)

A camera system, comprising:

an imaging device;
and
an optical system configured to form an object image on the imaging device, wherein the imaging device includes:
a pixel array circuit, wherein the pixel array circuit includes a first pixel and a second pixel;
a first switch coupled to the first pixel via a first column signal line;
a first capacitor coupled to the first switch;
a second switch coupled to the second pixel via a second column signal line;
a second capacitor coupled to the second switch;
a third switch coupled to the first pixel and the second capacitor;
a fourth switch coupled to the second pixel and the first capacitor;
a reference signal generator configured to generate a reference signal;
and
a comparator configured to compare the reference signal with a first pixel signal transmitted via the first column signal line,
wherein a first input terminal of the comparator is coupled to at least one of the first capacitor or the second capacitor, and
wherein a second input terminal of the comparator is coupled to the reference signal generator via a third capacitor.

12 more elements

Dependencies are inferred from the claim text.

Facts

Application

16/031,291Filed 10 Jul 2018

Priority

JP 2011-1257083 Jun 2011

Published

8 Nov 2018

Term ends

Not estimatedThe source records don’t support an estimate.

Classification10 codes

H04N 25/77
Addressed sensors, e.g. MOS or CMOS sensors: pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
H04N 25/40
Circuitry of solid-state image sensors [SSIS]; Control thereof: extracting pixel data from image sensors by controlling scanning circuits, e.g. by…
H04N 25/445
By partially reading an SSIS array: by skipping some contiguous pixels within the read portion of the array
H04N 25/46
Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled: by…

Family

Application13/474,287Continuation · filed 17 May 2012

Application14/494,087Continuation · filed 23 Sep 2014

Application14/732,349Continuation · filed 5 Jun 2015

Application15/140,196Continuation · filed 27 Apr 2016

Application15/612,930Continuation · filed 2 Jun 2017

Application16/031,291Continuation

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