Thyristor Volatile Random Access Memory and Methods of Manufacture
AssigneeTC Lab, Inc.
InventorsHarry Luan, Bruce L. Bateman, Valery Axelrad, Charlie Cheng
Life of this patent
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AssigneeTC Lab, Inc.
InventorsHarry Luan, Bruce L. Bateman, Valery Axelrad, Charlie Cheng
Estimating the term…
Operations with reduced current overall are performed on single thyristor memory cells forming a volatile memory cell cross-point array. An operation is performed on at least one memory cell in a first group of memory cells out of a plurality of groups of memory cells coupled to a line. A first voltage is applied across the first group of memory cells for the operation and a lower second voltage is applied across the other groups of memory cells. The first voltage is then applied across a second group of memory cells while the second voltage is applied across the other groups including the first group of memory cells. These steps may repeated until the operations covers all the groups.
In a volatile memory array having i anode lines, j cathode lines, and an array of thyristor memory cells, each memory cell having only one thyristor, the thyristor having a first electrode coupled to an anode line and a second electrode coupled to a cathode line, and in which N thyristor memory cells are connected to a selected anode line, a method of reducing current in the selected anode line to be accessed for an operation comprising:
In a cross-point array of memory cells, each memory cell having only one thyristor, the thyristor connected between an anode line and a cathode line, a method of performing a write or read operation on a row of memory cells of the cross-point array, comprising:
In a cross-point array of memory cells, each memory cell having only one thyristor, the thyristor connected between an anode line and a cathode line, a method of storing data in the array comprising:
Dependencies are inferred from the claim text.