Anti-scatter filter for an x-ray inspection system, x-ray inspection system and operation of an x-ray inspection system
AssigneeYxlon International GmbH
InventorsKlaus BAVENDIEK, Uwe HEIKE
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AssigneeYxlon International GmbH
InventorsKlaus BAVENDIEK, Uwe HEIKE
Estimating the term…
The invention relates to an anti-scatter filter 4 for an X-ray inspection system which has an X-ray source 2 with a main beam direction, an X-ray detector 3 and a compartment 16 for introducing an inspection part 5 between X-ray source 2 and X-ray detector 3, wherein the anti-scatter filter 4 is rotatable about an axle 9 which can be driven by a drive motor 10, wherein the axle 9, in the installed state in the X-ray inspection system, is substantially perpendicular to the surface of the X-ray detector 3, wherein the anti-scatter filter 4 has several sheet-like lamellae 12 made of a material that strongly absorbs X-rays, wherein the surfaces of the lamellae 12 are aligned substantially parallel to the main beam direction, wherein the lamellae 12 extend radially out from the axle 9, wherein the lamellae are borne in a common mount 11 at their radially outer ends.
An anti-scatter filter (4) for an X-ray inspection system which has an X-ray source (2) with a main beam direction, an X-ray detector (3) and a compartment (16) for introducing an inspection part (5) between X-ray source (2) and X-ray detector (3),
The anti-scatter filter (4) according to claim, wherein the mount (11) is annular, which is preferably arranged concentrically around the axle (9) and preferably consists of material of high tensile strength.
The anti-scatter filter (4) according to claim, wherein arranged in the mount (11) there are a first plate (14), which is arranged in front of the lamellae (12) in relation to the X-ray source (1) when the anti-scatter filter (4) is installed in the X-ray inspection system, and/or a second plate (15), which is arranged behind the lamellae (12) in relation to the X-ray source (1) when the anti-scatter filter (4) is installed in the X-ray inspection system.
Dependencies are inferred from the claim text.