Systems and methods for inspection and defect detection using 3-d scanning

A system for detecting defects in objects comprising:

• one or more depth cameras configured to capture a plurality of depth images of a target object;
• a processor configured to control the one or more depth cameras;
• a memory storing instructions that, when executed by the processor, cause the processor to:
• control the one or more depth cameras to capture the plurality of depth images of the target object;
• compute a three-dimensional (3-D) model of the target object using the depth images;
• render one or more views of the 3-D model;
• compute a descriptor by supplying the one or more views of the 3-D model to a convolutional stage of a convolutional neural network;
• supply the descriptor to a defect detector to compute one or more defect classifications of the target object;
• and
• output the one or more defect classifications of the target object.