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US 2018/0321312 A1Published application
Test device
AssigneeSK hynix Inc.
InventorSung-Soo CHI
Life of this patent
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Abstract
A test device includes: a test control unit suitable for detecting a deterioration-expected unit circuit among a plurality of unit circuits included in a test-subject device according to operation histories of the plural unit circuits, and detecting a deterioration degree according to a test output value of the deterioration-expected unit circuit; and an interface unit suitable for routing control operation results and test results between the test control unit and the test-subject device during a test operation.
Claims7
A semiconductor system comprising:
- a test control unit suitable for detecting a deterioration-expected unit circuit among a plurality of unit circuits included in a test-subject device according to operation histories of the plural unit circuits, and generating deterioration degrees as analysis result information of different normal operations according to a test output value of the deterioration-expected unit circuit;
- and
- the test-subject device suitable for performing a corresponding one among the different normal operations in response to an output signal of the option control unit.
Dependencies are inferred from the claim text.