Apparatus and method for performing avalanche mode delta vsd testing
AssigneeIntegrated Technology Corporation
InventorsSteven T. Clauter, Ausin Hsu, Gary B. Rogers, Bradley Thomas Wolford
Life of this patent
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Abstract
A device and method for performing Avalanche Mode Delta VsD testing of a semiconductor device under test (DUT), include a current source configured to provide energy in the form of a substantially non-decaying current to a DUT for heating of the DUT during an avalanche mode; and test circuitry electrically couplable to the current source and the DUT and configured to perform Avalanche Mode Delta VsD testing of the DUT.
Claims19
A device for performing Avalanche Mode Delta VsD testing of a semiconductor device under test (DUT), comprising:
- a current source configured to provide energy in the form of a substantially non-decaying current to a DUT for heating of the DUT during an avalanche mode;
- and
- test circuitry electrically couplable to the current source and the DUT and configured to perform Avalanche Mode Delta VsD testing of the DUT.
A method for performing testing of a power semiconductor device under test (DUT), the method comprising:
- driving a DUT using an Avalanche Mode for heating of the DUT, and then performing a Delta VSD testing of the DUT.
Dependencies are inferred from the claim text.