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AssigneePegatron Corporation
InventorsChih-Ho CHEN, Wen-Pin LI, Guo-Yuan TSENG, Yu-Ting CHEN
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A testing system is suitable for receiving at least one testing item of multiple device under tests (DUTs). The testing system comprises a plurality of testing devices and an arrangement unit. The arrangement unit is coupled to the testing devices. The arrangement unit generates at least one testing instruction according to the at least one testing item and detects an idle state corresponding to the at least one testing instruction, and transmits the at least one testing instruction to the testing device in the idle state, so as to trigger the testing device in the idle state to test the corresponding DUT according to the at least one testing instruction and generate a testing result.
A testing system suitable for receiving at least one testing item from a plurality of device under tests (DUTs), comprising:
A testing method suitable for a testing system comprising a plurality of testing devices and an arrangement unit, wherein the testing method comprises:
An arrangement unit suitable for receiving at least one testing item of a plurality of DUTs and electrically connected to a plurality of testing devices, wherein the arrangement unit comprises:
Dependencies are inferred from the claim text.