Foreign-matter inspection device
AssigneesIshida Co., Ltd., Nissin Electronics Co., Ltd.
InventorsTakuya YAEGASHI, Takayuki TANAKA
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AssigneesIshida Co., Ltd., Nissin Electronics Co., Ltd.
InventorsTakuya YAEGASHI, Takayuki TANAKA
Estimating the term…
A foreign-matter inspection device includes a transporting unit transporting an object to be inspected, an X-ray inspection unit detecting a foreign matter included in the object transported by the transporting unit by using permeability of X-rays, a metal detection unit detecting a foreign matter included in the object transported by the transporting unit by using an interaction between a magnetic field and a metal, and a housing accommodating the X-ray inspection unit, the metal detection unit, and at least a part of the transporting unit therein and keeping the X-rays of the X-ray inspection unit from leaking outside. The housing is provided with a door part opening and closing the housing. The door part abuts against the housing via an insulating body in a closed state.
A foreign-matter inspection device comprising:
Dependencies are inferred from the claim text.