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US 2018/0321084 A1Published application
Xenon suppression filter for spectrometry
AssigneeOcean Optics, Inc.
InventorPaul W. Ave
Life of this patent
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Abstract
A device for improving the suppression of light from a Pulsed Xenon light source for spectrometry by combining a Variable Longpass Order-Sorting filter with a Dichroic Balancing filter coated on a fused Silica substrate is disclosed.
Claims2
A Pulsed Xenon light source suppression filter used between a grating and a detector array in a spectrometer comprising:
- a Dichroic Balancing filter configured to suppress the visible light spectrum band in the 400-600 nm range resulting in the leveling of the intensity of the light spectrum across all bands emitted by said Pulsed Xenon light source coated on one side of a fused Silica filter substrate;
- and,
- a Variable Longpass Order-Sorting filter configured to remove second order stray light coated on the opposite side of said fused Silica filter substrate.
A Pulsed Xenon light source suppression filter used between a grating and a detector array in a spectrometer comprising:
- a Dichroic Balancing filter configured to suppress the visible light spectrum band in the 400-600 nm range resulting in the leveling of the intensity of the light spectrum across all bands emitted by said Pulsed Xenon light source coated on a first fused Silica filter substrate;
- a Variable Longpass Order-Sorting filter configured to remove second order stray light coated on a second fused Silica filter substrate;
- and,
- combining said first and second coated fused Silica filter substrates.
1 more element
Dependencies are inferred from the claim text.