Low Resistance Surface Contact Topography Mapping
AssigneeGeneral Electric Company
InventorsMichael E. Friedman, Jonathan Tilley, Brian Patrick Senkiw, Bryan Williams, Andrew Joseph Colletti
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AssigneeGeneral Electric Company
InventorsMichael E. Friedman, Jonathan Tilley, Brian Patrick Senkiw, Bryan Williams, Andrew Joseph Colletti
Estimating the term…
A system and method for testing rotor stack assemblies having a plurality of rotor disks is disclosed. A measurement system for measuring at least one electrical characteristic of the plurality of rotor disks is used with a computer electronically connected to the measurement system for capturing data from the measurement system. Software associated with the computer transforms the data into output used to determine flange joint contact topography in the plurality of rotor disks.
A system for testing rotor stack assemblies, comprising:
A method for testing a rotor stack having a plurality of rotor disks, comprising the steps of:
Dependencies are inferred from the claim text.