Cosmetic defect evaluation

A system for evaluating cosmetic defects of a device comprising:

• at least one test rig configured to capture a plurality of images of an exterior of the device;
• and
• a processor configured to:
• process images of the device captured by the at least one test rig into one or more final images;
• identify one or more defects of the device from the final images;
• compute a defect index based upon the identified one or more defects;
• and
• issue an evaluation of the device based upon the defect index in accordance with user-configured standards.

A computer program product including a non-transitory computer-readable storage medium storing computer-executable code for evaluating cosmetic defects of a device, wherein the code, when executed, is configured to cause one or more computers to:

• record a plurality of images of an exterior of the device under a plurality of lighting conditions;
• process the images of the device into one or more final images;
• identify one or more defects of the device from the final images;
• compute a defect index based upon the identified one or more defects;
• and
• issue an evaluation of the device based upon the defect index in accordance with user-configured standards.

A method for evaluating cosmetic defects of a device comprising:

• recording a plurality of images of the device under a plurality of lighting conditions;
• processing the images of the device into one or more final images;
• identifying one or more defects of the device from the one or more final images;
• and
• computing a defect index from the one or more identified defects.