Device and components overheating evaluation
AssigneePervacio Inc
InventorSanjay Kanodia
Life of this patent
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Abstract
A method for measuring temperature of a device includes measuring temperatures for each of a plurality of components or zones of the device and combining the temperatures measured into a device total temperature. A system for measuring temperature of a device includes a processor and a non-transitory memory component operatively coupled with the processor. The non-transitory memory component has, recorded thereto, computer readable instructions configured to cause the processor to measure temperatures for each of a plurality of components or zones of the device and combine the temperatures measured into a device total temperature.
Claims22
A method for evaluating overheating of a device, comprising:
- obtaining a plurality of temperature measurements for the device;
- combining the obtained temperature measurements into a device total temperature;
- and
- issuing an overheating notification when the device total temperature exceeds a threshold temperature.
A system for evaluating overheating of a device, comprising:
- a database containing threshold temperatures for a plurality of devices;
- a processor;
- a non-transitory memory component operatively coupled with the processor and, having recorded thereto, computer readable instructions configured to cause the processor to:
- obtain a plurality of temperature measurements for the device being evaluated;
- combine the obtained temperature measurements into a device total temperature;
- retrieve from the database, a threshold temperature associated with the device being evaluated;
- and
- issue an overheating notification when the device total temperature exceeds a threshold temperature associated with the device being evaluated.
A non-transitory computer-readable storage medium, having recorded thereto, computer readable instructions configured to evaluate overheating of a device, wherein the instructions, when executed, cause one or more processors to:
- obtain a plurality of temperature measurements for the device;
- combine the obtained temperature measurements into a device total temperature;
- and
- issue an overheating notification when the device total temperature exceeds a threshold temperature associated with the device.
A system for measuring temperature of a device, comprising:
- a processor;
- and
- a non-transitory memory component operatively coupled with the processor and having, recorded thereto, computer readable instructions configured to cause the processor to measure temperatures for each of a plurality of components of the device and combine the temperatures measured for the plurality of components into a device total temperature.
Dependencies are inferred from the claim text.