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AssigneeETS-Lindgren, Inc.
InventorMichael FOEGELLE
Estimating the term…
A method and system for measurement of a device under test (DUT) are provided. According to one aspect, a system includes a first positioner having a first antenna and a second positioner having a second antenna. The system also includes circuitry configured to cause the first antenna to radiate a test signal to the DUT and to implement one of a probing mode and an interference mode. The probing mode causes, for each of at least one position of the first antenna, the second antenna to receive a signal from the DUT at each of the second set of positions of the second antenna. The interfering mode causes, for each of at least one position of the first antenna, the second antenna to transmit an interfering signal to the DUT at each of the second set of positions of the second antenna.
A system configured to test a device under test (DUT) via one of a plurality of testing modes, the system comprising:
Equipment for testing a device under test, DUT, in one of a plurality of modes, the equipment comprising:
A non-transitory computer program storage medium having instructions that when executed by a processor, configure the processor to:
A method for testing a device under test, DUT, in one of a plurality of modes, the method comprising:
Dependencies are inferred from the claim text.