Composite charged particle beam device
AssigneeHitachi High-Technologies Corporation
InventorsYuta IMAI, Hideo MORISHITA, Toshihide AGEMURA
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AssigneeHitachi High-Technologies Corporation
InventorsYuta IMAI, Hideo MORISHITA, Toshihide AGEMURA
Estimating the term…
This composite charged particle beam device comprises a first charged particle beam column (6), a second charged particle beam column (1) which is equipped with a deceleration system, and is equipped with a detector (3) inside the column, a test piece stage (10) on which a test piece (9) is placed, and an electric field correction electrode (13) which is provided around the tip of the first charged particle beam column, wherein the electric field correction electrode is an electrode that corrects the electric field distribution formed in the vicinity of the test piece, and the electric field correction electrode is positioned between the test piece and the first charged particle beam column, and on the opposite side from the second charged particle beam column with respect to the optical axis of the first charged particle beam column.
A composite charged particle beam device comprising:
Dependencies are inferred from the claim text.