Test support device and test support method

A test support device, comprising:

• a memory;
• and
• a processor coupled to the memory and the processor configured to:
• acquire event information on events which occur during an execution of a target program to be tested;
• classify the events into event groups on basis of similarity of timings at which the respective events occur;
• calculate, for each of the event groups, a summed value of evaluation values of the respective events classified into the relevant event group;
• determine for each of the event groups, on basis of the summed value, whether a breakpoint of a target process is present at a timing corresponding to the relevant event group, the target process being executed by the target program;
• and
• display timing information indicating a timing at which a breakpoint is determined to be present, in association with elapsed time after a start of executing the target program.

A test support method, comprising:

• acquiring, by a computer, event information on events which occur during an execution of a target program to be tested;
• classifying the events into event groups on basis of similarity of timings at which the respective events occur;
• calculating, for each of the event groups, a summed value of evaluation values of the respective events classified into the relevant event group;
• determining for each of the event groups, on basis of the summed value, whether a breakpoint of a target process is present at a timing corresponding to the relevant event group, the target process being executed by the target program;
• and
• displaying timing information indicating a timing at which a breakpoint is determined to be present, in association with elapsed time after a start of executing the target program.