Inspection device for image pickup apparatus
AssigneeOlympus Corporation
InventorsHiroyuki NAGAMIZU, Kenji OMACHI, Kazuyoshi JINGU
Life of this patent
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AssigneeOlympus Corporation
InventorsHiroyuki NAGAMIZU, Kenji OMACHI, Kazuyoshi JINGU
Estimating the term…
An inspection device for image pickup apparatus includes: an image pickup apparatus including an image pickup device inside a first lens barrel; an angle-of-view conversion optical member made of a translucent resin member and including a first surface and a second surface that is an opposite surface of the first surface, the first surface being configured to closely contact a surface of a distal end lens, the surface of the distal end lens being exposed outside of the first lens barrel; a test chart including a chart surface provided so as to closely contact the second surface, and an image of the chart surface being picked up by the image pickup apparatus through the angle-of-view conversion optical member, and an illumination instrument that illuminates the chart surface.
An inspection device for image pickup apparatus comprising:
An inspection device for image pickup apparatus comprising:
Dependencies are inferred from the claim text.