Integrated circuit structure

Abstract

An integrated circuit structure including a reference circuit and at least two core circuits is provided. The reference circuit provides a reference current. The at least two core circuits are coupled to the reference circuit for receiving the reference current. Each of the core circuits includes a current-calibration circuit. The current-calibration circuit generates a bias current according to the reference current in the core circuit. The core circuits use the bias current to replace the reference circuit. In an IC test process, the reference circuit provides the reference current through the pin of the integrated circuit electronically connected to the external impedance. After the IC test process, the connection of the reference circuit and the pin of the integrated circuit is disconnected.

Dependencies are inferred from the claim text.